Hanno Melzner

According to our database, Hanno Melzner authored at least 2 papers between 2007 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening.

Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase

Proceedings of the 2014 International Test Conference, 2014

2007

Concurrent Wire Spreading, Widening, and Filling.

Olivier Rizzo, Hanno Melzner

Proceedings of the 44th Design Automation Conference, 2007