Haldun Kufluoglu

According to our database, Haldun Kufluoglu authored at least 6 papers between 2006 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Recovery modeling of negative bias temperature instability (NBTI) for SPICE-compatible circuit aging simulators.

Haldun Küflüoglu, Cathy Chancellor, Min Chen, Claude Cirba, Vijay Reddy

ACM J. Emerg. Technol. Comput. Syst., 2014

2007

Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits.

Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007

Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis.

Kunhyuk Kang, Haldun Kufluoglu, Kaushik Roy, Muhammad Ashraful Alam

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007

A comprehensive model for PMOS NBTI degradation: Recent progress.

Muhammad Ashraful Alam, Haldun Kufluoglu, Dhanoop Varghese, S. Mahapatra

Microelectron. Reliab., 2007

2006

Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI.

Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy

Proceedings of the 24th International Conference on Computer Design (ICCD 2006), 2006

Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits.

Bipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy

Proceedings of the Conference on Design, Automation and Test in Europe, 2006