Haichun Zhang

Orcid: 0000-0003-4272-7710

According to our database1, Haichun Zhang authored at least 16 papers between 2019 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2024
Fooling Decision-Based Black-Box Automotive Vision Perception Systems in Physical World.
IEEE Trans. Intell. Transp. Syst., July, 2024

Efficient Approximate Floating-Point Multiplier With Runtime Reconfigurable Frequency and Precision.
IEEE Trans. Circuits Syst. II Express Briefs, July, 2024

Intelligent mining methodology of product field failure data by fusing deep learning and association rules for after-sales service text.
Eng. Appl. Artif. Intell., 2024

A Survey on FPGA-based Accelerators for CKKS.
Proceedings of the IEEE International Test Conference in Asia, 2024

2023
ADLPT: Improving 3D NAND Flash Memory Reliability by Adaptive Lifetime Prediction Techniques.
IEEE Trans. Computers, June, 2023

LightWarner: Predicting Failure of 3D NAND Flash Memory Using Reinforcement Learning.
IEEE Trans. Computers, March, 2023

2022
Fooling the Eyes of Autonomous Vehicles: Robust Physical Adversarial Examples Against Traffic Sign Recognition Systems.
Proceedings of the 29th Annual Network and Distributed System Security Symposium, 2022

2021
Corrigendum to "Design and implementation of robust and low-cost SRAM PUF using PMOS and linear shift register extractor" [Microelectron. J. 103C (2020) 104844].
Microelectron. J., 2021

A Cyber Security Evaluation Framework for In-Vehicle Electrical Control Units.
IEEE Access, 2021

2020
CANsec: A Practical in-Vehicle Controller Area Network Security Evaluation Tool.
Sensors, 2020

An Improved Design and Implementation of a Range-Controlled Communication System for Mobile Phones.
Sensors, 2020

Design and implementation of robust and low-cost SRAM PUF using PMOS and linear shift register extractor.
Microelectron. J., 2020

Process-variation Effects on 3D TLC Flash Reliability: Characterization and Mitigation Scheme.
Proceedings of the 20th IEEE International Conference on Software Quality, 2020

Unexpected Error Explosion in NAND Flash Memory: Observations and Prediction Scheme.
Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019
A Blockchain-Based Privacy-Preserving Authentication Scheme for VANETs.
IEEE Trans. Very Large Scale Integr. Syst., 2019

A NAND Flash Endurance Prediction Scheme with FPGA-based Memory Controller System.
Proceedings of the 32nd IEEE International System-on-Chip Conference, 2019


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