H. W. Chen

According to our database, H. W. Chen authored at least 3 papers between 2010 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

The Demonstration of Gate Dielectric-fuse 4kb OTP Memory Feasible for Embedded Applications in High-k Metal-gate CMOS Generations and Beyond.

E. R. Hsieh, C. W. Chang, C. C. Chuang, H. W. Chen, Steve S. Chung

Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019

2010

Electrical characteristics and reliability properties of metal-oxide-semiconductor capacitors with HfZrLaO gate dielectrics.

Chuan-Hsi Liu, H. W. Chen

Microelectron. Reliab., 2010

Impact of Hf content on positive bias temperature instability reliability of HfSiON gate dielectrics.

H. W. Chen, Chuan-Hsi Liu

Microelectron. Reliab., 2010