H. V. Nguyen

According to our database, H. V. Nguyen authored at least 2 papers in 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime.

H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002

Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling.

H. V. Nguyen, Cora Salm, J. Vroemen, J. Voets, Benno Krabbenborg, Jaap Bisschop, A. J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002