H. H. Kim
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Bibliography
2023
Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/üm and Q = 180 to virtual-source modeling.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2023