H. George Henry

According to our database, H. George Henry authored at least 2 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2023

Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs.

Akhil S. Kumar, Michael J. Uren, Matthew D. Smith, Martin Kuball, Justin Parke, H. George Henry, Robert S. Howell

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2014

Methodology for accurate extrapolation of InGaP/GaAs HBT safe operating area (SOA) for variations in emitter area and ballast resistor size.

Robert S. Howell, Randall Lewis, H. George Henry, Harold Hearne, Deas Brown, Dale Dawson, Andris Ezis

Microelectron. Reliab., 2014