Gwanhyeob Koh

According to our database, Gwanhyeob Koh authored at least 6 papers between 2002 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2020

A 14.7Mb/mm² 28nm FDSOI STT-MRAM with Current Starved Read Path, 52Ω/Sigma Offset Voltage Sense Amplifier and Fully Trimmable CTAT Reference.

El Mehdi Boujamaa, Samsudeen Mohamed Ali, Steve Ngueya Wandji, Alexandra Gourio, Suk-Soo Pyo, Gwanhyeob Koh, Yoonjong Song, Taejoong Song, Jongwook Kye, Jean-Christophe Vial, Andrew Sowden, Manuj Rathor, Cyrille Dray

Proceedings of the IEEE Symposium on VLSI Circuits, 2020

2019

Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology.

Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, Taiki Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S. H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, Gwanhyeob Koh, K. C. Park, Sangwoo Pae, Gi-Tae Jeong, J. S. Yoon, E. S. Jung

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2017

28-nm 1T-1MTJ 8Mb 64 I/O STT-MRAM with symmetric 3-section reference structure and cross-coupled sensing amplifier.

Artur Antonyan, Suk-Soo Pyo, Hyuntaek Jung, Gwanhyeob Koh, Taejoong Song

Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

2005

A 0.18-μm 3.0-V 64-Mb nonvolatile phase-transition random access memory (PRAM).

Woo Yeong Cho, Beak-Hyung Cho, Byung-Gil Choi, Hyung-Rok Oh, Sangbeom Kang, Ki-Sung Kim, Kyung-Hee Kim, Du-Eung Kim, Choong-Keun Kwak, Hyun-Geun Byun, Youngnam Hwang, SuJin Ahn, Gwan-Hyeob Koh, Gitae Jeong, Hongsik Jeong, Kinam Kim

IEEE J. Solid State Circuits, 2005

2003

A 0.24-μm 2.0-V 1T1MTJ 16-kb nonvolatile magnetoresistance RAM with self-reference sensing scheme.

Gitae Jeong, Wooyoung Cho, Sujin Ahn, Hongsik Jeong, Gwanhyeob Koh, Youngnam Hwang, Kinam Kim

IEEE J. Solid State Circuits, 2003

2002

The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon.

Yongseok Ahn, Sanghyun Lee, Gwanhyeob Koh, Taeyoung Chung, Kinam Kim

Microelectron. Reliab., 2002