Gus Chang-Hung Han
According to our database1,
Gus Chang-Hung Han
authored at least 2 papers
between 2020 and 2021.
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Bibliography
2021
Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering.
Proceedings of the 26th IEEE European Test Symposium, 2021
2020
PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques.
Proceedings of the IEEE European Test Symposium, 2020