Guillaume Hubert

According to our database, Guillaume Hubert authored at least 28 papers between 2005 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Contribution of neutron spectrometry to monitor soil water content in an area subject to strong seasonal variations.

Anaïs Tilhac, Guillaume Hubert, Solène Derrien, Fabienne Lohou

Proceedings of the IGARSS 2024, 2024

Non-Invasive Attack on Ring Oscillator-Based PUFs Through Localized X-Ray Irradiation.

Nasr-Eddine Ouldei Tebina, Aghiles Douadi, Luc Salvo, Vincent Beroulle, Nacer-Eddine Zergainoh, Guillaume Hubert, Elena-Ioana Vatajelu, Giorgio Di Natale, Paolo Maistri

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2024

Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification.

Nasr-Eddine Ouldei Tebina, Luc Salvo, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023

SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles.

Juan Carlos Fabero, Golnaz Korkian, Francisco J. Franco, Guillaume Hubert, Hortensia Mecha, Manon Letiche, Juan Antonio Clemente

Microprocess. Microsystems, February, 2023

Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection.

Nasr-Eddine Ouldei Tebina, Laurent Maingault, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

Simulation Methodology for Assessing X-Ray Effects on Digital Circuits.

Nasr-Eddine Ouldei Tebina, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2022

An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation.

William Souza da Cruz, Raphael Viera, Jean-Baptiste Rigaud, Guillaume Hubert, Jean-Max Dutertre

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Flodam: Cross-Layer Reliability Analysis Flow for Complex Hardware Designs.

Angeliki Kritikakou, Olivier Sentieys, Guillaume Hubert, Youri Helen, Jean-Francois Coulon, Patrice Deroux-Dauphin

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Simulation of atmospheric cosmic-rays and their impacts based on pre-calculated databases, physical models and computational methods.

Guillaume Hubert, Sébastien Aubry

J. Comput. Sci., 2021

Further Analysis of Laser-induced IR-drop.

William Souza da Cruz, Raphael Andreoni Camponogara Viera, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert

Proceedings of the 30th IEEE Asian Test Symposium, 2021

2020

Simulation of Cosmic Radiation Transport Inside Aircraft for Safety Applications.

Adriane Cristina Mendes Prado, Mauricio Tizziani Pazianotto, José Manuel Quesada Molina, Miguel Antonio Cortes-Giraldo, Guillaume Hubert, Marlon Antonio Pereira, Claudio Antonio Federico

IEEE Trans. Aerosp. Electron. Syst., 2020

Impact of Ground-Level Enhancement (GLE) Solar Events on Soft Error Rate for Avionics.

Guillaume Hubert, Sébastien Aubry, Juan Antonio Clemente

IEEE Trans. Aerosp. Electron. Syst., 2020

Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell.

William Souza da Cruz, Jean-Max Dutertre, Jean-Baptiste Rigaud, Guillaume Hubert

Proceedings of the 33rd Symposium on Integrated Circuits and Systems Design, 2020

2019

Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs.

Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis

Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019

Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility.

Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis

Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019

2018

Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature.

Laurent Artola, Ahmad Al Youssef, Samuel Ducret, Franck Perrier, Raphael Buiron, Olivier Gilard, Julien Mekki, Mathieu Boutillier, Guillaume Hubert, Christian Poivey

Sensors, 2018

Impact of different transistor arrangements on gate variability.

Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis

Microelectron. Reliab., 2018

2017

The hemodynamic signal as a first-order low-pass temporal filter: Evidence and implications for neuroimaging studies.

Antoine Sauvage, Guillaume Hubert, Jonathan Touboul, Jérôme Ribot

NeuroImage, 2017

Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology.

Y. Q. de Aguiar, Laurent Artola, Guillaume Hubert, Cristina Meinhardt, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis

Microelectron. Reliab., 2017

2015

Impact of scaling on the soft error sensitivity of bulk, FDSOI and FinFET technologies due to atmospheric radiation.

Guillaume Hubert, Laurent Artola, D. Regis

Integr., 2015

2014

Comparative soft error evaluation of layout cells in FinFET technology.

Laurent Artola, Guillaume Hubert, Massimo Alioto

Microelectron. Reliab., 2014

Laser-induced fault effects in security-dedicated circuits.

Régis Leveugle, Paolo Maistri, Pierre Vanhauwaert, Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Athanasios Papadimitriou, David Hély, Vincent Beroulle, Guillaume Hubert, Stephan De Castro, Jean-Max Dutertre, Alexandre Sarafianos, Noemie Boher, Mathieu Lisart, Joel Damiens, Philippe Candelier, Clément Tavernier

Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

Laser-Induced Fault Effects in Security-Dedicated Circuits.

Vincent Beroulle, Philippe Candelier, Stephan De Castro, Giorgio Di Natale, Jean-Max Dutertre, Marie-Lise Flottes, David Hély, Guillaume Hubert, Régis Leveugle, Feng Lu, Paolo Maistri, Athanasios Papadimitriou, Bruno Rouzeyre, Clément Tavernier, Pierre Vanhauwaert

Proceedings of the VLSI-SoC: Internet of Things Foundations, 2014

Layout-aware laser fault injection simulation and modeling: From physical level to gate level.

Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Guillaume Hubert

Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

2009

A generic platform for remote accelerated tests and high altitude SEU experiments on advanced ICs: Correlation with MUSCA SEP3 calculations.

Guillaume Hubert, Raoul Velazco, Paul Peronnard

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2007

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells.

Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells.

Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005

A Review of DASIE Code Family: Contribution to SEU/MBU Understanding.

Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005