Guido T. Sasse

According to our database, Guido T. Sasse authored at least 4 papers between 2008 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

Aging models for n- and p-type LDMOS covering low, medium and high VGS operation.

Guido T. Sasse, Vignesh Subramanian, Ljubo Radic

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2018

Hot carrier induced TDDB in HV MOS: Lifetime model and extrapolation to use conditions.

Guido T. Sasse

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2012

The temperature dependence of mixed mode degradation in bipolar transistors.

Guido T. Sasse, Martin Combrié

Microelectron. Reliab., 2012

2008

RF CMOS reliability simulations.

Guido T. Sasse, Mustafa Acar, Fred G. Kuper, Jurriaan Schmitz

Microelectron. Reliab., 2008