Guido Gronthoud

According to our database, Guido Gronthoud authored at least 24 papers between 2000 and 2012.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2012

ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus.

Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud

J. Electron. Test., 2012

2009

Algorithms for ADC Multi-site Test with Digital Input Stimulus.

Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud

Proceedings of the 14th IEEE European Test Symposium, 2009

2008

Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design.

Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong

Proceedings of the 13th European Test Symposium, 2008

2007

Extending gate-level diagnosis tools to CMOS intra-gate faults.

Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud

IET Comput. Digit. Tech., 2007

Modeling Power Supply Noise in Delay Testing.

Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger

IEEE Des. Test Comput., 2007

On Performance Testing with Path Delay Patterns.

Bram Kruseman, Ananta K. Majhi, Guido Gronthoud

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Re-configuration of sub-blocks for effective application of time domain tests.

Jens Anders, Shaji Krishnan, Guido Gronthoud

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits.

Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud

J. Electron. Test., 2006

A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.

Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Power Supply Noise in Delay Testing.

Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Multi-VDD Testing for Analog Circuits.

José Pineda de Gyvez, Guido Gronthoud, Rashid Amine

J. Electron. Test., 2005

A New Algorithm for Dynamic Faults Detection in RAMs.

Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Functional vs. multi-VDD testing of RF circuits.

Estella Silva, José Pineda de Gyvez, Guido Gronthoud

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

A novel stuck-at based method for transistor stuck-open fault diagnosis.

Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Stuck-open fault diagnosis with stuck-at model.

Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud

Proceedings of the 10th European Test Symposium, 2005

Memory testing improvements through different stress conditions.

Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen

Proceedings of the 31st European Solid-State Circuits Conference, 2005

Memory Testing Under Different Stress Conditions: An Industrial Evaluation.

Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen

Proceedings of the 2005 Design, 2005

2004

On Hazard-free Patterns for Fine-delay Fault Testing.

Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Power Supply Ramping for Quasi-static Testing of PLLs.

José Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.

Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

VDD Ramp Testing for RF Circuits.

José Pineda de Gyvez, Guido Gronthoud, Rashid Amine

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Process-variability aware delay fault testing of ΔV_T and weak-open defects.

Daniel Arumí-Delgado, Rosa Rodríguez-Montañés, José Pineda de Gyvez, Guido Gronthoud

Proceedings of the 8th European Test Workshop, 2003

2001

Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design.

Liquan Fang, Guido Gronthoud, Hans G. Kerkhoff

Proceedings of the 6th European Test Workshop, 2001

2000

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?

Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000