Guan Feng
According to our database1,
Guan Feng
authored at least 2 papers
between 2018 and 2024.
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Bibliography
2024
Comprehensive Analysis of Duty-Cycle Induced Degradations in HfxZr1-xO2-Based Ferroelectric Capacitors: Behavior, Modeling, and Optimization.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
2018
Intell. Syst. Account. Finance Manag., 2018