Greg G. Freeman

According to our database, Greg G. Freeman authored at least 10 papers between 1986 and 2011.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2011

45-nm silicon-on-insulator CMOS technology integrating embedded DRAM for high-performance server and ASIC applications.

Subramanian S. Iyer, Greg G. Freeman, Colin Brodsky, Anthony I. Chou, Dan Corliss, Sameer H. Jain, Naftali E. Lustig, Vincent McGahay, Shreesh Narasimha, James P. Norum, Karen A. Nummy, Paul C. Parries, Sujatha Sankaran, Chris D. Sheraw, Pushkara Rao Varanasi, Geng Wang, Mary E. Weybright, Xiaojun Yu, Emmanuel Crabbe, Paul D. Agnello

IBM J. Res. Dev., 2011

2005

Scaling of SiGe Heterojunction Bipolar Transistors.

Jae-Sung Rieh, David R. Greenberg, Andreas Stricker, Greg G. Freeman

Proc. IEEE, 2005

2004

Reliability and performance scaling of very high speed SiGe HBTs.

Greg G. Freeman, Jae-Sung Rieh, Zhijian Yang, Fernando J. Guarín

Microelectron. Reliab., 2004

RFCMOS technology from 0.25μm to 65nm: the state of the art.

John J. Pekarik, David R. Greenberg, Basanth Jagannathan, Robert A. Groves, J. R. Jones, Raminderpal Singh, Anil Chinthakindi, Xudong Wang, Matthew J. Breitwisch, Douglas D. Coolbaugh, Peter E. Cottrell, John E. Florkey, Greg G. Freeman, R. Krishnasamy

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004

2003

Product applications and technology directions with SiGe BiCMOS.

Alvin J. Joseph, James S. Dunn, Greg G. Freeman, David L. Harame, Douglas Coolbaugh, Robert A. Groves, Kenneth J. Stein, Rich Volant, Seshadri Subbanna, V. S. Marangos, Stephen St. Onge, Ebenezer Eshun, P. Cooper, Jeffrey B. Johnson, Jae-Sung Rieh, Basanth Jagannathan, Vidhya Ramachandran, David Ahlgren, Dawn Wang, X. Wang

IEEE J. Solid State Circuits, 2003

Foundation of rf CMOS and SiGe BiCMOS technologies.

James S. Dunn, David C. Ahlgren, Douglas D. Coolbaugh, Natalie B. Feilchenfeld, Greg G. Freeman, David R. Greenberg, Robert A. Groves, Fernando J. Guarín, Youssef Hammad, Alvin J. Joseph, Louis D. Lanzerotti, Stephen A. St. Onge, Bradley A. Orner, Jae-Sung Rieh, Kenneth J. Stein, Steven H. Voldman, Ping-Chuan Wang, Michael J. Zierak, Seshadri Subbanna, David L. Harame, Dean A. Herman Jr., Bernard S. Meyerson

IBM J. Res. Dev., 2003

2002

40-Gb/s circuits built from a 120-GHz f_T SiGe technology.

Greg G. Freeman, Mounir Meghelli, Young Kwark, Steven Zier, Alexander V. Rylyakov, Michael Sorna, Todd Tanji, Oswin M. Schreiber, Keith Walter, Jae-Sung Rieh, Basanth Jagannathan, Alvin J. Joseph, Seshadri Subbanna

IEEE J. Solid State Circuits, 2002

2001

Silicon-germanium BiCMOS technology and a CAD environment for 2-40 GHz VLSI mixed-signal ICs.

Seshadri Subbanna, Lawrence Larson, Greg G. Freeman, David Ahlgren, Kenneth J. Stein, Carl E. Dickey, James Mecke, A. Rincon, P. Bacon, Robert A. Groves, Mehmet Soyuer, David L. Harame, James S. Dunn, David Rowe, W. Chon, Dean A. Herman Jr., Bernard S. Meyerson

Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, 2001

1998

A scaleable, statistical SPICE Gummel-Poon model for SiGe HBTs.

K. M. Walter, B. Ebersman, D. A. Sunderland, G. D. Berg, Greg G. Freeman, Robert A. Groves, D. K. Jadus, David L. Harame

IEEE J. Solid State Circuits, 1998

1986

Two CMOS Metastability Sensors.

Greg G. Freeman, Dick L. Liu, Bruce A. Wooley, Edward J. McCluskey

Proceedings of the Proceedings International Test Conference 1986, 1986