Graziella Scandurra
Orcid: 0000-0003-3295-0206
According to our database1,
Graziella Scandurra
authored at least 37 papers
between 2002 and 2024.
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Bibliography
2024
Development of a Simple Setup to Measure Shielding Effectiveness at Microwave Frequencies.
Sensors, June, 2024
Flicker Noise in Resistive Gas Sensors - Measurement Setups and Applications for Enhanced Gas Sensing.
Sensors, January, 2024
Robust Doppler Displacement Measurement Resolving the Uncertainty During Target Stationary Moment.
Proceedings of the IEEE Topical Conference on Wireless Sensors and Sensor Networks, 2024
A Simplified Topology for the Design of Low Noise Voltage Amplifiers for Low Frequency Noise Measurements.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024
A Simple, Portable, Two Channels Correlation Spectrum Analyzer for Low Frequency Noise Measurements.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024
2023
A Brief Review on Flexible Electronics for IoT: Solutions for Sustainability and New Perspectives for Designers.
Sensors, 2023
2021
A Two-Channel DFT Spectrum Analyzer for Fluctuation Enhanced Sensing Based on a PC Audio Board.
Sensors, 2021
Int. J. Emerg. Technol. Learn., 2021
2020
J. Sensors, 2020
2019
A programmable bias current compensation approach in current noise measurement applications.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2019
2017
Copper Oxide Chitosan Nanocomposite: Characterization and Application in Non-Enzymatic Hydrogen Peroxide Sensing.
Sensors, 2017
A PC based platform for accurate quartz tuning fork characterization and sensing applications.
Proceedings of the 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29, 2017
Proceedings of the 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29, 2017
Electrochemical detection of H2O2 using silver nanoparticles dispersed in Polyethyleneimine.
Proceedings of the 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29, 2017
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017
2015
Int. J. Circuit Theory Appl., 2015
A simple and effective testbench for quartz tuning fork characterization and sensing applications.
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015
Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level.
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015
2014
Electrochemical Detection of <i>p</i>-Aminophenol by Flexible Devices Based on Multi-Wall Carbon Nanotubes Dispersed in Electrochemically Modified Nafion.
Sensors, 2014
2013
Multichannel Amplifier Topologies for High-Sensitivity and Reduced Measurement Time in Voltage Noise Measurements.
IEEE Trans. Instrum. Meas., 2013
IEEE Trans. Instrum. Meas., 2013
Electrical Characterization and Hydrogen Peroxide Sensing Properties of Gold/Nafion: Polypyrrole/MWCNTs Electrochemical Devices.
Sensors, 2013
2012
2010
IEEE Trans. Instrum. Meas., 2010
A New Circuit Topology for the Realization of Very Low Noise, High Stability Voltage Sources.
IEEE Trans. Instrum. Meas., 2010
2009
IEEE Trans. Instrum. Meas., 2009
2007
A New Circuit Topology for the Realization of Very Low-Noise Wide-Bandwidth Transimpedance Amplifier.
IEEE Trans. Instrum. Meas., 2007
2006
Design and Realization of High-Accuracy Static Analog Memories (SAMs) Using Low-Cost DA Converters.
IEEE Trans. Instrum. Meas., 2006
How to enlarge the bandwidth without increasing the noise in OP-AMP-based transimpedance amplifier.
IEEE Trans. Instrum. Meas., 2006
Proceedings of the 13th IEEE International Conference on Electronics, 2006
Proceedings of the 13th IEEE International Conference on Electronics, 2006
2003
IEEE Trans. Instrum. Meas., 2003
2002
True constant temperature MTF test system for the characterization of electromigration of thick Cu interconnection lines.
Microelectron. Reliab., 2002