Grady Giles

According to our database, Grady Giles authored at least 18 papers between 1985 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Maximizing scan pin and bandwidth utilization with a scan routing fabric.

Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood

Proceedings of the IEEE International Test Conference, 2017

2016

Toward more efficient scan data bandwidth utilization on modern SOCs.

Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood

Proceedings of the 29th IEEE International System-on-Chip Conference, 2016

2015

Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures.

Wu-Tung Cheng, Yan Dong, Grady Giles, Yu Huang, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer

IEEE Trans. Very Large Scale Integr. Syst., 2015

2013

EDT bandwidth management - Practical scenarios for large SoC designs.

Jakub Janicki, Jerzy Tyszer, Wu-Tung Cheng, Yu Huang, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Yan Dong, Grady Giles

Proceedings of the 2013 IEEE International Test Conference, 2013

2010

The scan-DFT features of AMD's next-generation microprocessor core.

Mahmut Yilmaz, Baosheng Wang, Jayalakshmi Rajaraman, Tom Olsen, Kanwaldeep Sobti, Dwight Elvey, Jeff Fitzgerald, Grady Giles, Wei-Yu Chen

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor.

Kedarnath J. Balakrishnan, Grady Giles, James Wingfield

IEEE Des. Test Comput., 2009

2008

The Test Features of the Quad-Core AMD Opteron- Microprocessor.

Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja

Proceedings of the 2008 IEEE International Test Conference, 2008

Test Access Mechanism for Multiple Identical Cores.

Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield

Proceedings of the 2008 IEEE International Test Conference, 2008

2005

Built-in constraint resolution.

Grady Giles, Joel Irby, Daniela Toneva, Kun-Han Tsai

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2002

Is Scan (Alone) Sufficient to Test Today?s Microprocessors? Not Quite, but We Can?t Get the Job Done Without It.

Grady Giles

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000

Conversion of small functional test sets of nonscan blocks to scan patterns.

Don E. Ross, Tim Wood, Grady Giles

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1998

Test Development for Second-Generation ColdFire Microprocessors.

Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja

IEEE Des. Test Comput., 1998

1997

A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors.

Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1993

Case study of 1149.01 microprocessor implementations.

William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns

Microprocess. Microsystems, 1993

1991

Implementing 1149.1 on CMOS Microprocessors.

William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Testability considerations in the design of the MC68340 Integrated Processor Unit.

Philip E. Bishop, Grady Giles, Sudarshan Iyengar, C. Thomas Glover, Wai-On Law

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1986

Testability Features of the MC68851 PMMU.

Grady Giles, Kenneth Scheuer

Proceedings of the Proceedings International Test Conference 1986, 1986

1985

A Methodology for Testing Content Addressable Memories.

Grady Giles, Craig Hunter

Proceedings of the Proceedings International Test Conference 1985, 1985