Gottfried Kurz
According to our database1,
Gottfried Kurz
authored at least 2 papers
in 2018.
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Bibliography
2018
Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments.
Proceedings of the 48th European Solid-State Device Research Conference, 2018