Glenn H. Chapman

According to our database, Glenn H. Chapman authored at least 68 papers between 1988 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of two.

2024

Image Degradation due to Interacting Hot Pixels and SEUs.

Glenn H. Chapman, Alireza Farahmandpour, Amit Chakma, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024

2023

Image Degradation in Time Due to Interacting Hot Pixels.

Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2022

Image Degradation due to Interacting Adjacent Hot Pixels.

Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Fault Tolerance for Islandable-Microgrid Sensors.

Vijay K. Jain, Glenn H. Chapman

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

Dependence of SEUs in Digital Cameras on Pixel size and Elevation.

Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2020

Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019

Image degradation from hot pixel defects with pixel size shrinkage.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2019, 2019

Detecting SEUs in Noisy Digital Imagers with small pixels.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren

Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

2018

Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2018, 2018

Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels.

Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren

Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018

2017

Post arrays for the immobilization of vapochromic coordination polymers for chemical sensors.

David Stevens, Bonnie L. Gray, David Yin, Glenn H. Chapman, Daniel B. Leznoff

Proceedings of the 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29, 2017

Hot Pixel Behavior as Pixel Size Reduces to 1 micron.

Glenn H. Chapman, Rahul Thomas, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2017, 2017

Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm.

Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017

2016

Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes.

Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren

Proceedings of the Image Sensors and Imaging Systems 2016, 2016

Experimental study and analysis of soft and permanent errors in digital cameras.

Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren

Proceedings of the 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2016

2015

Enhanced correction methods for high density hot pixel defects in digital imagers.

Glenn H. Chapman, Rahul Thomas, Rohit Thomas, Zahava Koren, Israel Koren

Proceedings of the Image Sensors and Imaging Systems 2015, 2015

Single Event Upsets and Hot Pixels in digital imagers.

Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

2014

Correcting high-density hot pixel defects in digital imagers.

Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren

Proceedings of the Image Sensors and Imaging Systems 2014, 2014

Improved correction for hot pixels in digital imagers.

Glenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren

Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

2013

Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO.

Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren

Proceedings of the Sensors, 2013

Improved image accuracy in Hot Pixel degraded digital cameras.

Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012

Do more camera pixels result in a better picture?

Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO.

Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren

Proceedings of the Sensors, 2012

Relating digital imager defect rates to pixel size, sensor area and ISO.

Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2011

Simulating enhanced photo carrier collection in the multifinger photogate active pixel sensors.

Phanindra Kalyanam, Glenn H. Chapman, M. Parameswaran

Proceedings of the Sensors, 2011

Tradeoffs in imager design parameters for sensor reliability.

Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren

Proceedings of the Sensors, 2011

Enhanced Defect Tolerance through Matrixed Deployment of Intelligent Sensors for the Smart Power Grid.

Vijay K. Jain, Glenn H. Chapman

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

Predicting Pixel Defect Rates Based on Image Sensor Parameters.

Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

Creating Defect Tolerance in Microfluidic Capacitive/Photonic Biosensors.

Glenn H. Chapman, Bonnie L. Gray, Vijay K. Jain

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

2010

Massively Deployable Intelligent Sensors for the Smart Power Grid.

Vijay K. Jain, Glenn H. Chapman

Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010

Tradeoffs in Imager Design with Respect to Pixel Defect Rates.

Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren

Proceedings of the 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2010

2009

Statistical identification and analysis of defect development in digital imagers.

Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren

Proceedings of the Digital Photography V, 2009

Characterization of Gain Enhanced In-Field Defects in Digital Imagers.

Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

2008

Automatic Detection of In-field eld Defect Growth in Image Sensors.

Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

Defect Tolerance for a Capacitance Based Nanoscale Biosensor.

Glenn H. Chapman, Vijay K. Jain

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

2007

A Multiprocessor System-on-Chip Implementation of a Laser-based Transparency Meter on an FPGA.

James Dykes, Paulman Chan, Glenn H. Chapman, Lesley Shannon

Proceedings of the 2007 International Conference on Field-Programmable Technology, 2007

Identification of in-field defect development in digital image sensors.

Jozsef Dudas, Linda Wu, Cory Jung, Glenn H. Chapman, Zahava Koren, Israel Koren

Proceedings of the Digital Photography III, San Jose, CA, USA, January 29-30, 2007, 2007

Quantitative Analysis of In-Field Defects in Image Sensor Arrays.

Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects.

Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Glenn H. Chapman

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

2006

Subsurface Bioimaging using Angular Domain Optical Backscattering Illumination.

Fartash Vasefi, Paulman K. Y. Chan, Bozena Kaminska, Glenn H. Chapman

Proceedings of the 28th International Conference of the IEEE Engineering in Medicine and Biology Society, 2006

Defect Tolerant and Energy Economized DSP Plane of a 3-D Heterogeneous SoC.

Vijay K. Jain, Glenn H. Chapman

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies.

Michelle L. La Haye, Cory Jung, David Chen, Glenn H. Chapman, Jozsef Dudas

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

On-Line Mapping of In-Field Defects in Image Sensor Arrays.

Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005

A highly reconfigurable computing array: DSP plane of a 3D heterogeneous SoC.

Vijay K. Jain, Sanjukta Bhanja, Glenn H. Chapman, Lavanya Doddannagari

Proceedings of the Proceedings 2005 IEEE International SOC Conference, 2005

A parallel architecture for the ICA algorithm: DSP plane of a 3-D heterogeneous sensor.

Vijay K. Jain, Sanjukta Bhanja, Glenn H. Chapman, Lavanya Doddannagari, Nguyen Nguyen

Proceedings of the 2005 IEEE International Conference on Acoustics, 2005

On-Line Identification of Faults in Fault-Tolerant Imagers.

Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

Inter-Plane Via Defect Detection Using the Sensor Plane in 3-D Heterogeneous Sensor Systems.

Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

2004

A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction.

Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren

IEEE Des. Test Comput., 2004

Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS).

Michelle L. La Haye, Glenn H. Chapman, Cory Jung, Desmond Y. H. Cheung, Sunjaya Djaja, Benjamin Wang, Gary Liaw, Yves Audet

Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

Defect Avoidance in a 3-D Heterogeneous Sensor.

Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali

Proceedings of the 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 2004

2003

Special section on defect and fault tolerance in VLSI systems.

Régis Leveugle, Glenn H. Chapman

Microelectron. J., 2003

Level-Hybrid Optoelectronic TESH Interconnection Network.

Vijay K. Jain, Glenn H. Chapman

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS).

Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Cheung, Yves Audet

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

2001

Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip.

Israel Koren, Zahava Koren, Glenn H. Chapman

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

Design of a Self-Correcting Active Pixel Sensor.

Yves Audet, Glenn H. Chapman

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

2000

A Self-Correcting Active Pixel Camera.

Israel Koren, Zahava Koren, Glenn H. Chapman

Proceedings of the 15th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2000), 2000

1999

Creating 35 mm Camera Active Pixel Sensors.

Glenn H. Chapman, Yves Audet

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

1998

Using Laser Defect Avoidance to Build Large-Area FPGAs.

Glenn H. Chapman, Benoit Dufort

IEEE Des. Test Comput., 1998

FPGA Design for Decimeter Scale Integration (DMSI).

Glenn H. Chapman

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

1997

Guest Editorial Foreword to the Special Section on WSI'95.

Stuart K. Tewksbury, Glenn H. Chapman

IEEE Trans. Very Large Scale Integr. Syst., 1997

Yield improvement of a large area magnetic field sensor array using redundancy schemes.

Yves Audet, Glenn H. Chapman

IEEE Trans. Very Large Scale Integr. Syst., 1997

Laser Correcting Defects to Create Transparent Routing for Large Area FPGA's.

Glenn H. Chapman, Benoit Dufort

Proceedings of the 1997 ACM/SIGDA Fifth International Symposium on Field Programmable Gate Arrays, 1997

Laser defect correction applications to FPGA based custom computers.

Glenn H. Chapman, Benoit Dufort

Proceedings of the 5th IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM '97), 1997

1996

Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays.

Glenn H. Chapman, Benoit Dufort

Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996

1995

Wafer-scale integration defect avoidance tradeoffs between laser links and Omega network switching.

Glenn H. Chapman, D. E. Bergen, K. Fang

Proceedings of the 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1995

1994

Laser Processes for Defect Correction in Large Area VLSI Systems.

Glenn H. Chapman

Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1994

1992

Wafer-Scale Transducer Arrays.

Glenn H. Chapman, M. Parameswaran, Marek Syrzycki

Computer, 1992

1988

A Monolithic Hough Transform Processor Based on Restructurable VLSI.

F. Matthew Rhodes, Joseph J. Dituri, Glenn H. Chapman, Bruce E. Emerson, Antonio M. Soares, Jack I. Raffel

IEEE Trans. Pattern Anal. Mach. Intell., 1988