Giulio Borghello

According to our database, Giulio Borghello authored at least 5 papers between 2016 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2019

Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose.

Aristeidis Nikolaou, Loukas Chevas, Alexia Papadopoulou, Nikolaos Makris, Matthias Bucher, Giulio Borghello, Federico Faccio

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

2018

Extending a 65nm CMOS process design kit for high total ionizing dose effects.

Aristeidis Nikolaou, Matthias Bucher, Nikos Makris, Alexia Papadopoulou, Loukas Chevas, Giulio Borghello, Henri D. Koch, Kostas Kloukinas, Tuomas S. Poikela, Federico Faccio

Proceedings of the 7th International Conference on Modern Circuits and Systems Technologies, 2018

Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS.

Loukas Chevas, Aristeidis Nikolaou, Matthias Bucher, Nikolaos Makris, Alexia Papadopoulou, Apostolos Zografos, Giulio Borghello, Henri D. Koch, Federico Faccio

Proceedings of the 25th International Conference "Mixed Design of Integrated Circuits and System", 2018

2017

Total ionizing dose effects on analog performance of 28 nm bulk MOSFETs.

C.-M. Zhang, Farzan Jazaeri, Alessandro Pezzotta, Claudio Bruschini, Giulio Borghello, S. Mattiazzo, Andrea Baschirotto, Christian C. Enz

Proceedings of the 47th European Solid-State Device Research Conference, 2017

2016

Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC.

Alessandro Pezzotta, C.-M. Zhang, Farzan Jazaeri, Claudio Bruschini, Giulio Borghello, Federico Faccio, S. Mattiazzo, Andrea Baschirotto, Christian C. Enz

Proceedings of the 46th European Solid-State Device Research Conference, 2016