Giovanni Nicoletti

According to our database, Giovanni Nicoletti authored at least 4 papers between 2006 and 2013.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2013

Failure causes generating aluminium protrusion/extrusion.

Peter Jacob, Giovanni Nicoletti

Microelectron. Reliab., 2013

2009

Reading distance degradation mechanisms of near-field RFID devices.

Peter Jacob, Willy Knecht, Albert Kunz, Giovanni Nicoletti, Thomas Lautenschlager, Moreno Mondada, Damien Pachoud

Microelectron. Reliab., 2009

2007

Device decapsulated (and/or depassivated) - Retest ok - What happened?

Peter Jacob, Giovanni Nicoletti, Florian Hauf

Microelectron. Reliab., 2007

2006

Reliability and wearout characterisation of LEDs.

Peter Jacob, Albert Kunz, Giovanni Nicoletti

Microelectron. Reliab., 2006