Giorgio Vannini
Orcid: 0000-0002-9533-9693
According to our database1,
Giorgio Vannini
authored at least 10 papers
between 1990 and 2024.
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2024
A New Calibration Technique of Electromagnetic Simulators for Accurate Analyses of Microwave Components on Epitaxial Wafers.
IEEE Access, 2024
2022
Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers.
IEICE Trans. Electron., October, 2022
2018
Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers.
Proceedings of the 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2018
2017
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017
2011
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime.
Microelectron. Reliab., 2011
A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices.
Comput. Stand. Interfaces, 2011
2009
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime.
IEEE Trans. Instrum. Meas., 2009
2005
IEEE Trans. Instrum. Meas., 2005
2002
Proceedings of the 2002 International Symposium on Circuits and Systems, 2002
1990
Mathematical approaches to electron device modelling for non-linear microwave circuit design: State of the art and present trends.
Eur. Trans. Telecommun., 1990