Giorgio Insinga

According to our database, Giorgio Insinga authored at least 6 papers between 2021 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2023

A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test.

Paolo Bernardi, Giorgio Insinga, Nima Kolahimahmoudi

Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023

Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests.

Paolo Bernardi, Gabriele Filipponi, Tommaso Foscale, Giorgio Insinga

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip.

Giorgio Insinga, M. Battilana, M. Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, Pierre Scaramuzza, Rudolf Ullmann

Proceedings of the IEEE European Test Symposium, 2023

2022

Recent Trends and Perspectives on Defect-Oriented Testing.

Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip.

Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, M. Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann

Proceedings of the IEEE European Test Symposium, 2022

2021

Industrial best practice: cases of study by automotive chip- makers.

L. Degli Abbati, Rudolf Ullmann, G. Paganini, M. Coppetta, L. Zaia, Vincent Huard, O. Montfort, Riccardo Cantoro, Giorgio Insinga, F. Venini, P. Calao, Paolo Bernardi

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021