Gilles Gasiot

According to our database, Gilles Gasiot authored at least 13 papers between 2008 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs.

Soilihi Moindjie, Jean-Luc Autran, Daniela Munteanu, Gilles Gasiot, Philippe Roche

Microelectron. Reliab., 2017

2016

30% static power improvement on ARM Cortex^®-A53 using static biasing-anticipation.

Fady Abouzeid, Christophe Bernicot, Sylvain Clerc, Jean-Marc Daveau, Gilles Gasiot, Daniel Noblet, Dimitri Soussan, Philippe Roche

Proceedings of the ESSCIRC Conference 2016: 42^nd European Solid-State Circuits Conference, 2016

2015

ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure.

Jean-Luc Autran, Daniela Munteanu, Soilihi Moindjie, Tarek Saad Saoud, S. Sauze, Gilles Gasiot, Philippe Roche

Microelectron. Reliab., 2015

Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis.

Victor Malherbe, Gilles Gasiot, Dimitri Soussan, Aurelien Patris, Jean-Luc Autran, Philippe Roche

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs.

Gilles Gasiot, Dimitri Soussan, Jean-Luc Autran, Victor Malherbe, Philippe Roche

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test.

Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Gilles Gasiot, Fady Abouzeid, Sylvain Clerc, Lirida A. B. Naviner, Philippe Roche

Proceedings of the IEEE International Reliability Physics Symposium, 2015

28nm FD-SOI technology and design platform for sub-10pJ/cycle and SER-immune 32bits processors.

Fady Abouzeid, Sylvain Clerc, Cyril Bottoni, Benjamin Coeffic, Jean-Marc Daveau, Damien Croain, Gilles Gasiot, Dimitri Soussan, Philippe Roche

Proceedings of the ESSCIRC Conference 2015, 2015

2014

Real-time soft-error rate measurements: A review.

Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot

Microelectron. Reliab., 2014

Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits.

Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu, Sylvain Clerc, Gilles Gasiot, Philippe Roche

Microelectron. Reliab., 2014

2012

A 0.32V, 55fJ per bit access energy, CMOS 65nm bit-interleaved SRAM with radiation Soft Error tolerance.

Sylvain Clerc, Fady Abouzeid, Gilles Gasiot, David Gauthier, Dimitri Soussan, Philippe Roche

Proceedings of the IEEE International Conference on IC Design & Technology, 2012

A 65nm SRAM achieving 250mV retention and 350mV, 1MHz, 55fJ/bit access energy, with bit-interleaved radiation Soft Error tolerance.

Sylvain Clerc, Fady Abouzeid, Gilles Gasiot, David Gauthier, Philippe Roche

Proceedings of the 38th European Solid-State Circuit conference, 2012

2010

Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level.

Jean-Luc Autran, Daniela Munteanu, Philippe Roche, Gilles Gasiot, S. Martinie, S. Uznanski, S. Sauze, S. Semikh, Evgeny Yakushev, S. Rozov, Pia Loaiza, G. Warot, M. Zampaolo

Microelectron. Reliab., 2010

2008

Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS.

Philippe Roche, Mark Lysinger, Gilles Gasiot, Jean-Marc Daveau, Mehdi Zamanian, Pierre Dautriche

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008