Gilles Festes

According to our database, Gilles Festes authored at least 6 papers between 2010 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG.

Ralf Richter, Stefan Dünkel, Bert Müller, Frank Mauersberger, Sven Wittek, Sven Beyer, Jana Böhme, Uwe Ritter, Violetta Sessi, Zhen Xu, Maximilian Drescher, Jinho Kim, Parviz Ghazavi, Yuri Tkachev, Latt Tee, Zonglin Li, Mandana Tadayoni, Fan Luo, Nhan Do, Serguei Jourba, Catherine Decobert, Gilles Festes, Bruno Villard, Thibaut Pate-Cazal

Proceedings of the IEEE International Memory Workshop, 2024

2023

Analog Tuning of Floating-Gate Cells with Sub-Elementary Charge Accuracy for In-Memory Computing Applications.

Yuri Tkachev, Steven Lemke, Louisa Schneider, Gilles Festes, Parviz Ghazavi

Proceedings of the IEEE International Memory Workshop, 2023

Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays.

Viktor Markov, Gilles Festes, Louisa Schneider, Steven Lemke, Serguei Jourba, Alexander Kotov

Proceedings of the IEEE International Memory Workshop, 2023

2012

Analysis and Fault Modeling of Actual Resistive Defects in ATMEL TSTAC^TM eFlash Memories.

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez

J. Electron. Test., 2012

2011

On using a SPICE-like TSTAC™ eFlash model for design and test.

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

2010

A two-layer SPICE model of the ATMEL TSTAC^TM eFlash memory technology for defect injection and faulty behavior prediction.

Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez

Proceedings of the 15th European Test Symposium, 2010