Gilles Amadou Koné

According to our database, Gilles Amadou Koné authored at least 5 papers between 2010 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Advancements on reliability-aware analog circuit design.

Bertrand Ardouin, Jean-Yves Dupuy, Jean Godin, Virginie Nodjiadjim, Muriel Riet, François Marc, Gilles Amadou Koné, Sudip Ghosh, Brice Grandchamp, Cristell Maneux

Proceedings of the 38th European Solid-State Circuit conference, 2012

2011

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses.

G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin

Microelectron. Reliab., 2011

Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design.

Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin

Microelectron. Reliab., 2011

2010

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT.

G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin

Microelectron. Reliab., 2010

Thermal aging model of InP/InGaAs/InP DHBT.

Sudip Ghosh, François Marc, Cristell Maneux, Brice Grandchamp, G. A. Koné, Thomas Zimmer

Microelectron. Reliab., 2010