Gian Antonio Susto
Orcid: 0000-0001-5739-9639
According to our database1,
Gian Antonio Susto
authored at least 127 papers
between 2010 and 2024.
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Bibliography
2024
Heterogeneous domain adaptation and equipment matching: DANN-based Alignment with Cyclic Supervision (DBACS).
Comput. Ind. Eng., January, 2024
Active Learning-based Isolation Forest (ALIF): Enhancing anomaly detection with expert feedback.
Inf. Sci., 2024
On the limitations of adversarial training for robust image classification with convolutional neural networks.
Inf. Sci., 2024
Bayesian active learning isolation forest (B-ALIF): A weakly supervised strategy for anomaly detection.
Eng. Appl. Artif. Intell., 2024
Eng. Appl. Artif. Intell., 2024
CoRR, 2024
A Distributed Approach to Autonomous Intersection Management via Multi-Agent Reinforcement Learning.
CoRR, 2024
CoRR, 2024
Enabling Efficient and Flexible Interpretability of Data-driven Anomaly Detection in Industrial Processes with AcME-AD.
CoRR, 2024
A Fairness-Oriented Reinforcement Learning Approach for the Operation and Control of Shared Micromobility Services.
CoRR, 2024
CoRR, 2024
Bayesian Deep Learning for Remaining Useful Life Estimation via Stein Variational Gradient Descent.
CoRR, 2024
Deep learning-based quality prediction for multi-stage sequential hot rolling processes in heavy rail manufacturing.
Comput. Ind. Eng., 2024
Adversarially Robust Fault Zone Prediction in Smart Grids With Bayesian Neural Networks.
IEEE Access, 2024
Proceedings of the Explainable Artificial Intelligence, 2024
An empirical evaluation of tinyML architectures for Class-Incremental Continual Learning.
Proceedings of the IEEE International Conference on Pervasive Computing and Communications Workshops and other Affiliated Events, 2024
Proceedings of the 32nd Mediterranean Conference on Control and Automation, 2024
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024
Unveiling the Anomalies in an Ever-Changing World: A Benchmark for Pixel-Level Anomaly Detection in Continual Learning.
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2024
Proceedings of the American Control Conference, 2024
2023
Fault Diagnosis using eXplainable AI: A transfer learning-based approach for rotating machinery exploiting augmented synthetic data.
Expert Syst. Appl., December, 2023
J. Open Source Softw., September, 2023
Interpretable Anomaly Detection with DIFFI: Depth-based feature importance of Isolation Forest.
Eng. Appl. Artif. Intell., March, 2023
AcME - Accelerated model-agnostic explanations: Fast whitening of the machine-learning black box.
Expert Syst. Appl., 2023
A multi-label Continual Learning framework to scale deep learning approaches for packaging equipment monitoring.
Eng. Appl. Artif. Intell., 2023
Eng. Appl. Artif. Intell., 2023
ExIFFI and EIF+: Interpretability and Enhanced Generalizability to Extend the Extended Isolation Forest.
CoRR, 2023
CoRR, 2023
Proceedings of the Sixteenth ACM International Conference on Web Search and Data Mining, 2023
Proceedings of the IEEE International Conference on Metrology for eXtended Reality, 2023
Predictive Maintenance in the Industry: A Comparative Study on Deep Learning-based Remaining Useful Life Estimation.
Proceedings of the 21st IEEE International Conference on Industrial Informatics, 2023
Proceedings of the 21st IEEE International Conference on Industrial Informatics, 2023
Proceedings of the 13th Italian Information Retrieval Workshop (IIR 2023), 2023
VIR2EM: VIrtualization and Remotization for Resilient and Efficient Manufacturing: Project-Dissemination Paper.
Proceedings of the Forum on Specification & Design Languages, 2023
Proceedings of the 2nd European Workshop on Algorithmic Fairness, 2023
2022
IEEE Trans. Control. Syst. Technol., 2022
FORMULA: A Deep Learning Approach for Rare Alarms Predictions in Industrial Equipment.
IEEE Trans Autom. Sci. Eng., 2022
A Deep Convolutional Autoencoder-Based Approach for Anomaly Detection With Industrial, Non-Images, 2-Dimensional Data: A Semiconductor Manufacturing Case Study.
IEEE Trans Autom. Sci. Eng., 2022
J. Assoc. Inf. Sci. Technol., 2022
Inf. Sci., 2022
Identifying Faked Responses in Questionnaires with Self-Attention-Based Autoencoders.
Informatics, 2022
IntroVAC: Introspective Variational Classifiers for learning interpretable latent subspaces.
Eng. Appl. Artif. Intell., 2022
Band Relevance Factor (BRF): a novel automatic frequency band selection method based on vibration analysis for rotating machinery.
CoRR, 2022
Active Learning-based Isolation Forest (ALIF): Enhancing Anomaly Detection in Decision Support Systems.
CoRR, 2022
A Revised Isolation Forest procedure for Anomaly Detection with High Number of Data Points.
Proceedings of the 23rd IEEE Latin American Test Symposium, 2022
SMART-IC: Smart Monitoring and Production Optimization for Zero-waste Semiconductor Manufacturing.
Proceedings of the 23rd IEEE Latin American Test Symposium, 2022
Proceedings of the Equity and Access in Algorithms, Mechanisms, and Optimization, 2022
Proceedings of the IEEE Conference on Control Technology and Applications, 2022
Anomaly Detection for the Industrial Internet of Things: an Unsupervised Approach for Fast Root Cause Analysis.
Proceedings of the IEEE Conference on Control Technology and Applications, 2022
2021
IEEE Robotics Autom. Lett., 2021
Informatics, 2021
Fault Detection of Bearing: An Unsupervised Machine Learning Approach Exploiting Feature Extraction and Dimensionality Reduction.
Informatics, 2021
CoRR, 2021
An Explainable Artificial Intelligence Approach for Unsupervised Fault Detection and Diagnosis in Rotating Machinery.
CoRR, 2021
A Scalable Deep Learning-Based Approach for Anomaly Detection in Semiconductor Manufacturing.
Proceedings of the Winter Simulation Conference, 2021
A Data Management and Anomaly Detection Solution for the Entertainment Industry (Discussion Paper).
Proceedings of the 29th Italian Symposium on Advanced Database Systems, 2021
A Machine Learning-based Approach for Advanced Monitoring of Automated Equipment for the Entertainment Industry.
Proceedings of the IEEE International Workshop on Metrology for Industry 4.0 & IoT, 2021
Proceedings of the 11th Italian Information Retrieval Workshop 2021, 2021
Proceedings of the Advances in Information Retrieval, 2021
Proceedings of the Second International Conference on Design of Experimental Search & Information REtrieval Systems, 2021
Proceedings of the IEEE Conference on Control Technology and Applications, 2021
Proceedings of the Advances in Bias and Fairness in Information Retrieval, 2021
Proceedings of the 1st Italian Workshop on Artificial Intelligence and Applications for Business and Industries (AIABI 2021) co-located with 20th International Conference of the Italian Association for Artificial Intelligence (AI*IA 2021), 2021
Algorithmic Audit of Italian Car Insurance: Evidence of Unfairness in Access and Pricing.
Proceedings of the AIES '21: AAAI/ACM Conference on AI, 2021
Proceedings of the Thirty-Fifth AAAI Conference on Artificial Intelligence, 2021
2020
Data-Driven Anomaly Recognition for Unsupervised Model-Free Fault Detection in Artificial Pancreas.
IEEE Trans. Control. Syst. Technol., 2020
IEEE Trans Autom. Sci. Eng., 2020
Gender stereotype reinforcement: Measuring the gender bias conveyed by ranking algorithms.
Inf. Process. Manag., 2020
Directional adversarial training for cost sensitive deep learning classification applications.
Eng. Appl. Artif. Intell., 2020
Sparse Logistic Regression: Comparison of Regularization and Bayesian Implementations.
Algorithms, 2020
Enhancing Scalability of Virtual Metrology: A Deep Learning-Based Approach for Domain Adaptation.
Proceedings of the Winter Simulation Conference, 2020
Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing.
Proceedings of the Winter Simulation Conference, 2020
Proceedings of the IEEE/RSJ International Conference on Intelligent Robots and Systems, 2020
Proceedings of the Seventh Italian Conference on Computational Linguistics, 2020
2019
Hunger classification of <i>Lates calcarifer</i> by means of an automated feeder and image processing.
Comput. Electron. Agric., 2019
Proceedings of the Companion of The 2019 World Wide Web Conference, 2019
Explainable Machine Learning in Industry 4.0: Evaluating Feature Importance in Anomaly Detection to Enable Root Cause Analysis.
Proceedings of the 2019 IEEE International Conference on Systems, Man and Cybernetics, 2019
A Deep Learning-based Approach to Anomaly Detection with 2-Dimensional Data in Manufacturing.
Proceedings of the 17th IEEE International Conference on Industrial Informatics, 2019
Proceedings of the 10th Italian Information Retrieval Workshop, 2019
Probabilistic Word Embeddings in Neural IR: A Promising Model That Does Not Work as Expected (For Now).
Proceedings of the 2019 ACM SIGIR International Conference on Theory of Information Retrieval, 2019
Proceedings of the 17th European Control Conference, 2019
What are the Most Informative Data for Virtual Metrology? A use case on Multi-Stage Processes Fault Prediction.
Proceedings of the 15th IEEE International Conference on Automation Science and Engineering, 2019
2018
A Methodology for Efficient Dynamic Spatial Sampling and Reconstruction of Wafer Profiles.
IEEE Trans Autom. Sci. Eng., 2018
Proceedings of the 16th European Control Conference, 2018
WS4ABSA: An NMF-Based Weakly-Supervised Approach for Aspect-Based Sentiment Analysis with Application to Online Reviews.
Proceedings of the Discovery Science - 21st International Conference, 2018
Proceedings of the 57th IEEE Conference on Decision and Control, 2018
Proceedings of the IEEE Conference on Control Technology and Applications, 2018
Proceedings of the 14th IEEE International Conference on Automation Science and Engineering, 2018
A machine learning approach for gesture recognition with a lensless smart sensor system.
Proceedings of the 15th IEEE International Conference on Wearable and Implantable Body Sensor Networks, 2018
A Fraud Detection Decision Support System via Human On-Line Behavior Characterization and Machine Learning.
Proceedings of the First International Conference on Artificial Intelligence for Industries, 2018
2017
Deep learning for virtual metrology: Modeling with optical emission spectroscopy data.
Proceedings of the 3rd IEEE International Forum on Research and Technologies for Society and Industry, 2017
2016
IEEE Trans. Ind. Informatics, 2016
PsychNology J., 2016
A parsimonious approach for activity recognition with wearable devices: An application to cross-country skiing.
Proceedings of the 15th European Control Conference, 2016
Proceedings of the 21st IEEE International Conference on Emerging Technologies and Factory Automation, 2016
2015
IEEE Trans. Ind. Informatics, 2015
IEEE Trans Autom. Sci. Eng., 2015
Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach.
Comput. Oper. Res., 2015
Slow release drug dissolution profile prediction in pharmaceutical manufacturing: A multivariate and machine learning approach.
Proceedings of the IEEE International Conference on Automation Science and Engineering, 2015
2014
A machine learning based approach for gesture recognition from inertial measurements.
Proceedings of the 53rd IEEE Conference on Decision and Control, 2014
Proceedings of the 2014 IEEE International Conference on Automation Science and Engineering, 2014
Proceedings of the 2014 IEEE International Conference on Automation Science and Engineering, 2014
2013
Prediction of integral type failures in semiconductor manufacturing through classification methods.
Proceedings of 2013 IEEE 18th Conference on Emerging Technologies & Factory Automation, 2013
A predictive maintenance system for integral type faults based on support vector machines: An application to ion implantation.
Proceedings of the 2013 IEEE International Conference on Automation Science and Engineering, 2013
Virtual metrology enabled early stage prediction for enhanced control of multi-stage fabrication processes.
Proceedings of the 2013 IEEE International Conference on Automation Science and Engineering, 2013
2012
Proceedings of the 51th IEEE Conference on Decision and Control, 2012
An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control.
Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012
Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012
Proceedings of the IEEE International Conference on Control Applications, 2012
2011
A Virtual Metrology system for predicting CVD thickness with equipment variables and qualitative clustering.
Proceedings of the IEEE 16th Conference on Emerging Technologies & Factory Automation, 2011
Proceedings of the IEEE Conference on Automation Science and Engineering, 2011
2010