Gerhard Groos

According to our database, Gerhard Groos authored at least 6 papers between 2001 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Transient analysis of latent damage formation in SMD capacitors by Transmission Line Pulsing (TLP).

Dennis Helmut, Gerhard K. M. Wachutka, Gerhard Groos

Microelectron. Reliab., 2017

2012

Characterisation method for chip card ESD events causing terminal failures.

Gerhard Groos

Microelectron. Reliab., 2012

2005

Automated setup for thermal imaging and electrical degradation study of power DMOS devices.

Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos

Microelectron. Reliab., 2005

2004

Multiple-time-instant 2D thermal mapping during a single ESD event.

Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik

Microelectron. Reliab., 2004

2003

Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.

M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher

Microelectron. Reliab., 2003

2001

Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.

Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher

Microelectron. Reliab., 2001