George J. Papaioannou
Orcid: 0000-0002-1036-3986
According to our database1,
George J. Papaioannou
authored at least 34 papers
between 2004 and 2018.
Collaborative distances:
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Bibliography
2018
Charging mechanisms in Y<sub>2</sub>O<sub>3</sub> dielectric films for MEMS capacitive switches.
Microelectron. Reliab., 2018
2017
Temperature accelerated discharging processes through the bulk of PECVD silicon nitride films for MEMS capacitive switches.
Microelectron. Reliab., 2017
Electrical properties of SiN<sub>x</sub> films with embedded CNTs for MEMS capacitive switches.
Microelectron. Reliab., 2017
2016
Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness.
Microelectron. Reliab., 2016
An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches.
Microelectron. Reliab., 2016
2015
Microelectron. Reliab., 2015
Induced charging phenomena on SiN<sub>x</sub> dielectric films used in RF MEMS capacitive switches.
Microelectron. Reliab., 2015
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
2014
A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches.
Microelectron. Reliab., 2014
2013
Microelectron. Reliab., 2013
2012
Microelectron. Reliab., 2012
Microelectron. Reliab., 2012
Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches.
Microelectron. Reliab., 2012
2011
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818].
Microelectron. Reliab., 2011
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies.
Microelectron. Reliab., 2011
Determination of bulk discharge current in the dielectric film of MEMS capacitive switches.
Microelectron. Reliab., 2011
2010
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques.
Microelectron. Reliab., 2010
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress.
Microelectron. Reliab., 2010
2009
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions.
Microelectron. Reliab., 2009
Microelectron. Reliab., 2009
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs.
Microelectron. Reliab., 2009
2008
Microelectron. Reliab., 2008
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique.
Microelectron. Reliab., 2008
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.
Microelectron. Reliab., 2008
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches.
Microelectron. Reliab., 2008
2007
Microelectron. Reliab., 2007
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques.
Microelectron. Reliab., 2007
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2007
2006
Microelectron. Reliab., 2006
2005
Microelectron. Reliab., 2005
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs.
Microelectron. Reliab., 2005
2004
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors.
Microelectron. Reliab., 2004
Microelectron. Reliab., 2004