Geoffrey Yeap
Orcid: 0000-0002-7767-7656
According to our database1,
Geoffrey Yeap
authored at least 14 papers
between 2010 and 2023.
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Bibliography
2023
A 4.24GHz 128X256 SRAM Operating Double Pump Read Write Same Cycle in 5nm Technology.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
2021
A 5-nm 135-Mb SRAM in EUV and High-Mobility Channel FinFET Technology With Metal Coupling and Charge-Sharing Write-Assist Circuitry Schemes for High-Density and Low-V<sub>MIN</sub> Applications.
IEEE J. Solid State Circuits, 2021
2020
15.1 A 5nm 135Mb SRAM in EUV and High-Mobility-Channel FinFET Technology with Metal Coupling and Charge-Sharing Write-Assist Circuitry Schemes for High-Density and Low-VMIN Applications.
Proceedings of the 2020 IEEE International Solid- State Circuits Conference, 2020
2016
Single Bit-Line 7T SRAM Cell for Near-Threshold Voltage Operation With Enhanced Performance and Energy in 14 nm FinFET Technology.
IEEE Trans. Circuits Syst. I Regul. Pap., 2016
Unified Technology Optimization Platform using Integrated Analysis (UTOPIA) for holistic technology, design and system co-optimization at <= 7nm nodes.
Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016
-197dBc/Hz FOM 4.3-GHz VCO Using an addressable array of minimum-sized nmos cross-coupled transistor pairs in 65-nm CMOS.
Proceedings of the 2016 IEEE Symposium on VLSI Circuits, 2016
2015
Single-Ended 9T SRAM Cell for Near-Threshold Voltage Operation With Enhanced Read Performance in 22-nm FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst., 2015
SRAM Design for 22-nm ETSOI Technology: Selective Cell Current Boosting and Asymmetric Back-Gate Write-Assist Circuit.
IEEE Trans. Circuits Syst. I Regul. Pap., 2015
Proceedings of the Symposium on VLSI Circuits, 2015
Transistor-interconnect mobile system-on-chip co-design method for holistic battery energy minimization.
Proceedings of the Symposium on VLSI Circuits, 2015
2014
Improved device variability in scaled MOSFETs with deeply retrograde channel profile.
Microelectron. Reliab., 2014
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014
2011
2010
Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010