Geoff Shofner

According to our database, Geoff Shofner authored at least 3 papers between 2011 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture.

Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak

Proceedings of the 2016 IEEE International Test Conference, 2016

2013

Fault analysis and simulation of large scale industrial mixed-signal circuits.

Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev

Proceedings of the Design, Automation and Test in Europe, 2013

2011

Case Study: Efficient SDD test generation for very large integrated circuits.

Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor

Proceedings of the 29th IEEE VLSI Test Symposium, 2011