Gennady V. Svetlov

According to our database, Gennady V. Svetlov authored at least 8 papers between 2018 and 2021.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2021

The Method for Estimating the Error Probability of Multithreshold Decoder for Self-Orthogonal Codes.

Boris Vasilevich Kostrov, Gennady V. Ovechkin, Natalya N. Grinchenko, Gennady V. Svetlov

Proceedings of the 10th Mediterranean Conference on Embedded Computing, 2021

Model for Landscape Images Transmission Through a Communication Channel.

Natalia Khizrieva, Natalya N. Grinchenko, Gennady V. Svetlov, Andrey Rodionov

Proceedings of the 10th Mediterranean Conference on Embedded Computing, 2021

2020

Analytical Estimation of Self-Orthogonal Code Multithreshold Decoders Efficiency.

Gennady V. Ovechkin, Natalya N. Grinchenko, Gennady V. Svetlov, Nataliy S. Fokina

Proceedings of the 9th Mediterranean Conference on Embedded Computing, 2020

Calculation of Image Transmission Partial Spectrum.

Aleksandr S. Bastrychkin, Boris V. Kostrov, Natalya N. Grinchenko, Gennady V. Svetlov

Proceedings of the 9th Mediterranean Conference on Embedded Computing, 2020

2019

The Characteristics of the Information Protection Systems Design for Corporate Information Systems.

Aleksey I. Baranchikov, Natalya N. Grinchenko, Gennady V. Svetlov, Nataliy S. Fokina

Proceedings of the 8th Mediterranean Conference on Embedded Computing, 2019

2018

Using a Tableau Method for Checking the Database Logical Structure Correctness.

Gennady V. Svetlov, Aleksey I. Baranchikov, Natalya N. Grinchenko, Nataliy S. Fokina

WiPiEC Journal, 2018

Fast image convolution calculation method with an ideal low-pass filter.

Boris V. Kostrov, Gennady V. Svetlov, Aleksey I. Baranchikov, Nataliy S. Fokina

Proceedings of the 7th Mediterranean Conference on Embedded Computing, 2018

Using a Tableau Method for Checking the Database Logical Structure Correctness.

Gennady V. Svetlov, Aleksey I. Baranchikov, Natalya N. Grinchenko, Nataliy S. Fokina, Boris V. Kostrov

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018