Gavin D. R. Hall

According to our database, Gavin D. R. Hall authored at least 5 papers between 2015 and 2021.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2021

Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors.

Konner E. K. Holden, Gavin D. R. Hall, Michael Cook, Chris Kendrick, Kaitlyn Pabst, Bruce Greenwood, Robin Daugherty, Jeff P. Gambino, Derryl D. J. Allman

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs.

Amartya Ghosh, Jifa Hao, Michael Cook, Chris Kendrick, Samia A. Suliman, Gavin D. R. Hall, Tom Kopley, Osama O. Awadelkarim

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Reliability of an Al2O3/SiO2MIM Capacitor for 180nm (3.3V) Technology.

Jeff Gambino, Derryl D. J. Allman, Gavin D. R. Hall, D. Price, L. Sheng, R. Takada, Y. Kanuma

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Device reliability for CMOS image sensors with backside through-silicon vias.

Jeff Peter Gambino, H. Soleimani, I. Rahim, B. Riebeek, L. Sheng, G. Hosey, H. Truong, Gavin D. R. Hall, R. Jerome, D. Price

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

An evaluation of accelerated failure time models of stress-migration and stress-induced voiding failures under vias.

Gavin D. R. Hall, Derryl D. J. Allman

Proceedings of the IEEE International Reliability Physics Symposium, 2015