Gaurav Bhargava

According to our database, Gaurav Bhargava authored at least 9 papers between 2007 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Non-Destructive Evaluation of Strength and Porosity of Bituminous Mixes Using Log- Periodic Feedlines-Based Ring Filter.

Amartya Paul, Gaurav Bhargava, Pradeep Kumar Gautam, Shubhankar Majumdar

IEEE Trans. Instrum. Meas., 2024

Design and Validation of a Microstrip Log-Periodic Feedline-Based Filter for Microwave Imaging of Rebar.

Amartya Paul, Gaurav Bhargava, Dibyendu Adak, Subhrajit Dutta, Shubhankar Majumdar

IEEE Trans. Instrum. Meas., 2024

2023

Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis.

Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava

Proceedings of the IEEE International Test Conference, 2023

2022

Diagnosing Double Faulty Chains through Failing Bit Separation.

Cheng-Sian Kuo, Bing-Han Hsieh, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava, Mason Chern

Proceedings of the IEEE International Test Conference, 2022

Using Custom Fault Models to Improve Understanding of Silicon Failures.

Subhadip Kundu, Gaurav Bhargava, Lesly Endrinal, Lavakumar Ranganathan

Proceedings of the IEEE International Test Conference, 2022

2021

Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization.

Mu-Ting Wu, Cheng-Sian Kuo, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava

Proceedings of the IEEE International Test Conference, 2021

AAA: Automated, On-ATE AI Debug of Scan Chain Failures.

Chris Nigh, Gaurav Bhargava, Ronald D. Blanton

Proceedings of the IEEE International Test Conference, 2021

2020

Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips.

Chih-Yan Liu, Mu-Ting Wu, James Chien-Mo Li, Gaurav Bhargava, Chris Nigh

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2007

Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns.

Gaurav Bhargava, Dale Meehl, James Sage

Proceedings of the 2007 IEEE International Test Conference, 2007