Gary Pomichter

According to our database, Gary Pomichter authored at least 7 papers between 2001 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

A 45nm SOI compiled embedded DRAM with random cycle times down to 1.3ns.

Mark Jacunski, Darren Anand, Robert Busch, John A. Fifield, Matthew Lanahan, Paul Lane, Adrian Paparelli, Gary Pomichter, Dale E. Pontius, Michael Roberge, Stephen Sliva

Proceedings of the IEEE Custom Integrated Circuits Conference, 2010

2007

Advancements in at-speed array BIST: multiple improvements.

Kevin W. Gorman, Michael Roberge, Adrian Paparelli, Gary Pomichter, Stephen Sliva, William Corbin

Proceedings of the 2007 IEEE International Test Conference, 2007

A 1.0GHz multi-banked embedded DRAM in 65nm CMOS featuring concurrent refresh and hierarchical BIST.

Darren Anand, Jim Covino, Jeffrey H. Dreibelbis, John A. Fifield, Kevin W. Gorman, Mark Jacunski, Jake Paparelli, Gary Pomichter, Dale E. Pontius, Michael Roberge, Stephen Sliva

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2006

Low Cost Test of High Bandwidth Embedded Memories.

Kevin W. Gorman, Darren Anand, Gary Pomichter, William R. Corbin

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

2005

A 500-MHz multi-banked compilable DRAM macro with direct write and programmable pipelining.

John E. Barth Jr., Darren Anand, Steve Burns, Jeffrey H. Dreibelbis, John A. Fifield, Kevin W. Gorman, Michael R. Nelms, Erik Nelson, Adrian Paparelli, Gary Pomichter, Dale E. Pontius, Stephen Sliva

IEEE J. Solid State Circuits, 2005

2002

Embedded DRAM design and architecture for the IBM 0.11-µm ASIC offering.

John E. Barth Jr., Jeffrey H. Dreibelbis, Eric A. Nelson, Darren Anand, Gary Pomichter, Peter Jakobsen, Michael R. Nelms, Jeffrey Leach, George M. Belansek

IBM J. Res. Dev., 2002

2001

Embedded DRAM built in self test and methodology for test insertion.

Peter Jakobsen, Jeffrey H. Dreibelbis, Gary Pomichter, Darren Anand, John Barth, Michael R. Nelms, Jeffrey Leach, George M. Belansek

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001