Gary May

According to our database1, Gary May authored at least 2 papers between 1996 and 1997.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of four.

Awards

IEEE Fellow

IEEE Fellow 2006, "For contributions to semiconductor manufacturing and engineering education.".

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

1997
Defect prediction for reactive ion etching using neural networks.
Proceedings of International Conference on Neural Networks (ICNN'97), 1997

1996
Real-time feedback control of reactive ion etching using neural networks.
Proceedings of International Conference on Neural Networks (ICNN'96), 1996


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