Gary Grise
According to our database1,
Gary Grise
authored at least 7 papers
between 2006 and 2010.
Collaborative distances:
Collaborative distances:
Timeline
2006
2007
2008
2009
2010
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Bibliography
2010
Low cost at-speed testing using On-Product Clock Generation compatible with test compression.
Proceedings of the 2011 IEEE International Test Conference, 2010
2007
An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation.
Proceedings of the 2007 IEEE International Test Conference, 2007
2006
Proceedings of the 2006 IEEE International Test Conference, 2006
Proceedings of the 16th ACM Great Lakes Symposium on VLSI 2006, Philadelphia, PA, USA, April 30, 2006
Proceedings of the 43rd Design Automation Conference, 2006
Design For At-Speed Structural Test And Performance Verification Of High-Performance ASICs.
Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006