Gang Li
Orcid: 0000-0001-9133-8282Affiliations:
- Wenzhou University, College of Electrical and Electronic Engineering, China
- Ningbo University, Institute of Circuits and Systems Institude of Circuits and Systems, Zhejiang, China
According to our database1,
Gang Li
authored at least 25 papers
between 2014 and 2024.
Collaborative distances:
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Bibliography
2024
SI PUF: An SRAM and Inverter-Based PUF With a Bit Error Rate of 0.0053% and 0.073/0.042 pJ/bit.
IEEE Trans. Circuits Syst. II Express Briefs, April, 2024
Bagua Protocol: A Whole-Process Configurable Protocol for IoT Sensing Devices Security Based on Strong PUF.
IEEE Internet Things J., January, 2024
Anti-machine-learning-attack strong PUF design based on multi-path delay selection strategy.
Microelectron. J., 2024
IEICE Electron. Express, 2024
2023
Machine learning attacks resistant strong PUF design utilizing response obfuscates challenge with lower hardware overhead.
Microelectron. J., December, 2023
IEEE Trans. Circuits Syst. I Regul. Pap., July, 2023
A challenge-screening strategy for enhancing the stability of strong PUF based on machine learning.
Microelectron. J., 2023
A greedy algorithm based Compensation Circuit for Optimizing the Output Statistics of APUF.
Microelectron. J., 2023
IEICE Electron. Express, 2023
Proceedings of the 15th IEEE International Conference on ASIC, 2023
Proceedings of the Asian Hardware Oriented Security and Trust Symposium, 2023
2022
IEICE Electron. Express, 2022
Proceedings of the Asian Hardware Oriented Security and Trust Symposium, 2022
2021
A Multimode Configurable Physically Unclonable Function With Bit-Instability-Screening and Power-Gating Strategies.
IEEE Trans. Very Large Scale Integr. Syst., 2021
Proceedings of the 14th IEEE International Conference on ASIC, 2021
2020
A 215-F² Bistable Physically Unclonable Function With an ACF of <0.005 and a Native Bit Instability of 2.05% in 65-nm CMOS Process.
IEEE Trans. Very Large Scale Integr. Syst., 2020
2019
Proceedings of the 13th IEEE International Conference on ASIC, 2019
2018
IEICE Electron. Express, 2018
2017
A multi-port low-power current mode PUF using MOSFET current-division deviation in 65 nm technology.
Microelectron. J., 2017
A highly reliable lightweight PUF circuit with temperature and voltage compensated for secure chip identification.
Proceedings of the 12th IEEE International Conference on ASIC, 2017
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2015
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015
2014
Proceedings of the 2014 International Symposium on Integrated Circuits (ISIC), 2014