Gang Chen

According to our database, Gang Chen authored at least 6 papers between 2003 and 2009.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2009

N-distinguishing Tests for Enhanced Defect Diagnosis.

Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2006

New Procedures to Identify Redundant Stuck-At Faults and Removal of Redundant Logic.

Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski

Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006

A test pattern ordering algorithm for diagnosis with truncated fail data.

Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski

Proceedings of the 43rd Design Automation Conference, 2006

2005

A unified fault model and test generation procedure for interconnect opens and bridges.

Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker

Proceedings of the 10th European Test Symposium, 2005

Defect Aware Test Patterns.

Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz

Proceedings of the 2005 Design, 2005

2003

Procedures for Identifying Untestable and Redundant Transition Faults in Synchronous Sequential Circuits.

Gang Chen, Sudhakar M. Reddy, Irith Pomeranz

Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003