Ganesh Srinivasan
According to our database1,
Ganesh Srinivasan
authored at least 23 papers
between 2004 and 2020.
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Bibliography
2020
Proceedings of the AH '20: 11th Augmented Human International Conference, 2020
2012
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012
2011
J. Electron. Test., 2011
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation.
Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011
2010
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices.
J. Electron. Test., 2010
IEEE Des. Test Comput., 2010
Proceedings of the 2011 IEEE International Test Conference, 2010
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures.
Proceedings of the 19th IEEE Asian Test Symposium, 2010
2008
IEEE Des. Test Comput., 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
2007
Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007
Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources.
Proceedings of the 16th Asian Test Symposium, 2007
2006
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006
2005
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications.
J. Electron. Test., 2005
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode.
Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers.
Proceedings of the 10th European Test Symposium, 2005
2004
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.
Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences.
Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit.
Proceedings of the 2004 Design, 2004
Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004