Gaelle Beylier

According to our database, Gaelle Beylier authored at least 3 papers between 2007 and 2019.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2019

Characterization and Modelling of High Speed Ge Photodetectors Reliability.

Fatoumata Sy, Quentin Rafhay, Julien Poëtte, Gregory Grosa, C. Besset, Gaelle Beylier, Philippe Grosse, David Roy, Jean-Emmanuel Broquin

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2008

Impact of silicon nitride CESL on NLDEMOS transistor reliability.

Gaelle Beylier, Sylvie Bruyère, Darcy Benoit, Gérard Ghibaudo

Microelectron. Reliab., 2008

2007

Refined electrical analysis of two charge states transition characteristic of "borderless" silicon nitride.

Gaelle Beylier, Sylvie Bruyère, Darcy Benoit, Gérard Ghibaudo

Microelectron. Reliab., 2007