Gabriele Boschi

According to our database, Gabriele Boschi authored at least 10 papers between 2005 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications.

Gabriele Boschi, Elisa Spano, Hayk T. Grigoryan, Arun Kumar, Gurgen Harutyunyan

Proceedings of the IEEE International Test Conference, 2020

2019

Innovative Practices on In-System Test and Reliability of Memories.

S. Bandyopadhyay, J. Mekkoth, Marc Hutner, Hayk T. Grigoryan, Arun Kumar, Samvel K. Shoukourian, Grigor Tshagharyan, Yervant Zorian, Gabriele Boschi, Duccio Lazzarotti, Donato Luongo, Hanna Shaheen, Gurgen Harutyunyan

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Memory FIT Rate Mitigation Technique for Automotive SoCs.

Gabriele Boschi, Donato Luongo, Duccio Lazzarotti, Hanna Shaheen, Hayk T. Grigoryan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2019

2018

Advanced Uniformed Test Approach For Automotive SoCs.

Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, N. Martirosyan, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2018

2017

Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs.

Tal Kogan, Yehonatan Abotbol, Gabriele Boschi, Gurgen Harutyunyan, I. Kroul, Hanna Shaheen, Yervant Zorian

Proceedings of the IEEE International Test Conference, 2017

Advanced ECC solution for automotive SoCs.

Hanna Shaheen, Gabriele Boschi, Gurgen Harutyunyan, Yervant Zorian

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2011

A verification strategy for fault-detection and fault-tolerance circuits.

Gabriele Boschi, Riccardo Mariani, Stefano Lorenzini

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

2007

A systematic approach for Failure Modes and Effects Analysis of System-On-Chips.

Riccardo Mariani, Gabriele Boschi

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Using an innovative SoC-level FMEA methodology to design in compliance with IEC61508.

Riccardo Mariani, Gabriele Boschi, Federico Colucci

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2005

Scrubbing and Partitioning for Protection of Memory Systems.

Riccardo Mariani, Gabriele Boschi

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005