Gabin An

According to our database, Gabin An authored at least 21 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

The 13th International Workshop on Genetic Improvement(GI @ ICSE 2024).

William B. Langdon, Gabin An, Aymeric Blot, Vesna Nowack, Justyna Petke, Shin Yoo, Oliver Krauss, Erik M. Fredericks, Daniel Blackwell

ACM SIGSOFT Softw. Eng. Notes, July, 2024

A Quantitative and Qualitative Evaluation of LLM-Based Explainable Fault Localization.

Sungmin Kang, Gabin An, Shin Yoo

Proc. ACM Softw. Eng., 2024

Lachesis: Predicting LLM Inference Accuracy using Structural Properties of Reasoning Paths.

Naryeong Kim, Sungmin Kang, Gabin An, Shin Yoo

CoRR, 2024

Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching.

Gabin An, Juyeon Yoon, Thomas Bach, Jingun Hong, Shin Yoo

Proceedings of the IEEE International Conference on Software Maintenance and Evolution, 2024

2023

Genetic Improvement @ ICSE 2023.

William B. Langdon, Vesna Nowack, Justyna Petke, Markus Wagner, Hyeonseok Lee, Erik M. Fredericks, Gabin An, Aymeric Blot

ACM SIGSOFT Softw. Eng. Notes, October, 2023

Learning test-mutant relationship for accurate fault localisation.

Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo

Inf. Softw. Technol., 2023

A Preliminary Evaluation of LLM-Based Fault Localization.

Sungmin Kang, Gabin An, Shin Yoo

CoRR, 2023

BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++.

Gabin An, Minhyuk Kwon, Kyunghwa Choi, Jooyong Yi, Shin Yoo

Proceedings of the 38th IEEE/ACM International Conference on Automated Software Engineering, 2023

Fonte: Finding Bug Inducing Commits from Failures.

Gabin An, Jingun Hong, Naryeong Kim, Shin Yoo

Proceedings of the 45th IEEE/ACM International Conference on Software Engineering, 2023

2022

FDG: a precise measurement of fault diagnosability gain of test cases.

Gabin An, Shin Yoo

Proceedings of the ISSTA '22: 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, Virtual Event, South Korea, July 18, 2022

Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA.

Gabin An, Juyeon Yoon, Jeongju Sohn, Jingun Hong, Dongwon Hwang, Shin Yoo

Proceedings of the 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, 2022

2021

Improving Test Distance for Failure Clustering with Hypergraph Modelling.

Gabin An, Juyeon Yoon, Joyce Jiyoung Whang, Shin Yoo

CoRR, 2021

Human-in-the-Loop Fault Localisation Using Efficient Test Prioritisation of Generated Tests.

Gabin An, Shin Yoo

CoRR, 2021

Searching for Multi-fault Programs in Defects4J.

Gabin An, Juyeon Yoon, Shin Yoo

Proceedings of the Search-Based Software Engineering - 13th International Symposium, 2021

Reducing the search space of bug inducing commits using failure coverage.

Gabin An, Shin Yoo

Proceedings of the ESEC/FSE '21: 29th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, 2021

Ahead of Time Mutation Based Fault Localisation using Statistical Inference.

Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo

Proceedings of the 32nd IEEE International Symposium on Software Reliability Engineering, 2021

Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study.

Jeongju Sohn, Gabin An, Jingun Hong, Dongwon Hwang, Shin Yoo

Proceedings of the 14th IEEE Conference on Software Testing, Verification and Validation, 2021

2019

The State and Future of Genetic Improvement.

William B. Langdon, Westley Weimer, Christopher Steven Timperley, Oliver Krauss, Zhen Yu Ding, Yiwei Lyu, Nicolas Chausseau, Eric M. Schulte, Shin Hwei Tan, Kevin Leach, Yu Huang, Gabin An

ACM SIGSOFT Softw. Eng. Notes, 2019

Amortising the Cost of Mutation Based Fault Localisation using Statistical Inference.

Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo

CoRR, 2019

PyGGI 2.0: language independent genetic improvement framework.

Gabin An, Aymeric Blot, Justyna Petke, Shin Yoo

Proceedings of the ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, 2019

2018

Comparing line and AST granularity level for program repair using PyGGI.

Gabin An, Jinhan Kim, Shin Yoo

Proceedings of the 4th International Genetic Improvement Workshop, 2018