G. Giusto

According to our database¹, G. Giusto authored at least 3 papers between 2003 and 2005.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

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Article

PhD thesis

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Bibliography

2005

Impact of interface and bulk trapped charges on transistor reliability.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2005

Tunnel oxide degradation under pulsed stress.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2005

2003

Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2003

G. Giusto

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On csauthors.net:

Bibliography

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