Fumio Tsuchiya
According to our database1,
Fumio Tsuchiya
authored at least 3 papers
between 2016 and 2019.
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Bibliography
2019
Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators.
IET Circuits Devices Syst., 2018
2016
FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs.
Proceedings of the ESSCIRC Conference 2016: 42<sup>nd</sup> European Solid-State Circuits Conference, 2016