Fumihiko Hayashi

According to our database, Fumihiko Hayashi authored at least 2 papers between 1992 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

Reliability driven guideline for BEOL Optimization: Protecting MOS stacks from hydrogen-related impurity penetration.

Ziyuan Liu, Fumihiko Hayashi, Shinji Fujieda, Markus Wilde, Katsuyuki Fukutani

Proceedings of the IEEE International Conference on IC Design & Technology, 2012

1992

A 3.3-V 12-ns 16-Mb CMOS SRAM.

Hiroyuki Goto, Hiroaki Ohkubo, Kenji Kondou, Masayoshi Ohkawa, Hitoshi Mitani, Shinichi Horiba, Masakazu Soeda, Fumihiko Hayashi, Yutaro Hachiya, Toshiyuki Shimizu, Manabu Ando, Zensuke Matsuda

IEEE J. Solid State Circuits, November, 1992