Friedrich Taenzler
According to our database1,
Friedrich Taenzler
authored at least 16 papers
between 1993 and 2014.
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Bibliography
2014
Development and empirical verification of an accuracy model for the power down leakage tests.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
2013
J. Electron. Test., 2013
Proceedings of the 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, 2013
2012
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012
2011
J. Electron. Test., 2011
2010
IEEE Des. Test Comput., 2010
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the 2011 IEEE International Test Conference, 2010
2008
IEEE Des. Test Comput., 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
Proceedings of the 2008 IEEE International Test Conference, 2008
2007
Proceedings of the 16th Asian Test Symposium, 2007
2006
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006
1993
Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing.
Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993