Friedrich Taenzler

According to our database1, Friedrich Taenzler authored at least 16 papers between 1993 and 2014.

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Bibliography

2014
Development and empirical verification of an accuracy model for the power down leakage tests.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

A novel BIST technique for LDMOS drivers.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

2013
Physics-Based Low-Cost Test Technique for High Voltage LDMOS.
J. Electron. Test., 2013

Physics Based Fault Models for Testing High-Voltage LDMOS.
Proceedings of the 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, 2013

2012
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

2011
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme.
J. Electron. Test., 2011

2010
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems.
IEEE Des. Test Comput., 2010

Low cost test and tuning of RF circuits and systems.
Proceedings of the 28th IEEE VLSI Test Symposium, 2010

RADPro: Automatic RF analyzer and diagnostic program generation tool.
Proceedings of the 2011 IEEE International Test Conference, 2010

2008
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers.
IEEE Des. Test Comput., 2008

Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms.
Proceedings of the 2008 IEEE International Test Conference, 2008

Optimized EVM Testing for IEEE 802.11a/n RF ICs.
Proceedings of the 2008 IEEE International Test Conference, 2008

2007
Production Test of High Volume Commercial RFIC.
Proceedings of the 16th Asian Test Symposium, 2007

2006
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms.
Proceedings of the Conference on Design, Automation and Test in Europe, 2006

1993
Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing.
Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993


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