Friedrich Peter Leisenberger
According to our database1,
Friedrich Peter Leisenberger
authored at least 7 papers
between 2006 and 2018.
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Bibliography
2018
High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs.
Proceedings of the 36th IEEE VLSI Test Symposium, 2018
2017
IEEE Trans. Very Large Scale Integr. Syst., 2017
2016
An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile Memories.
J. Electron. Test., 2016
Yield improvement of an EEPROM for automotive applications while maintaining high reliability.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
Variation and failure characterization through pattern classification of test data from multiple test stages.
Proceedings of the 2016 IEEE International Test Conference, 2016
2008
Elektrotech. Informationstechnik, 2008
2006
A Non-Volatile Embedded Memory for High Temperature Automotive and High-Retention Applications.
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006