Frédéric Verdier

According to our database, Frédéric Verdier authored at least 8 papers between 2001 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Combining Model-Driven Architecture and Software Product Line Engineering: Reuse of Platform-Specific Assets.

Frédéric Verdier, Abdelhak-Djamel Seriai, Raoul Taffo Tiam

Proceedings of the Model-Driven Engineering and Software Development, 2018

Reusing Platform-specific Models in Model-Driven Architecture for Software Product Lines.

Frédéric Verdier, Abdelhak-Djamel Seriai, Raoul Taffo Tiam

Proceedings of the 6th International Conference on Model-Driven Engineering and Software Development, 2018

2012

A methodological approach for predictive reliability: Practical case studies.

Hélène Frémont, Geneviève Duchamp, Alexandrine Guédon-Gracia, Frédéric Verdier

Microelectron. Reliab., 2012

2004

Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests.

Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé

Microelectron. Reliab., 2004

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.

Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto

Microelectron. Reliab., 2004

2003

Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.

Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard

Microelectron. Reliab., 2003

Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.

Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard

Microelectron. Reliab., 2003

2001

Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses.

Benoit Lambert, Nathalie Malbert, Nathalie Labat, Frédéric Verdier, André Touboul, P. Huguet, R. Bonnet, G. Pataut

Microelectron. Reliab., 2001