Frederic Neuveux

According to our database, Frederic Neuveux authored at least 8 papers between 2002 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Two-level compression through selective reseeding.

Peter Wohl, John A. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, Jonathon E. Colburn

Proceedings of the 2013 IEEE International Test Conference, 2013

2012

Hybrid selector for high-X scan compression.

Peter Wohl, John A. Waicukauski, Frederic Neuveux, Jonathon E. Colburn

Proceedings of the 2012 IEEE International Test Conference, 2012

2010

Fully X-tolerant, very high scan compression.

Peter Wohl, John A. Waicukauski, Frederic Neuveux, Emil Gizdarski

Proceedings of the 47th Design Automation Conference, 2010

2008

Increasing Scan Compression by Using X-chains.

Peter Wohl, John A. Waicukauski, Frederic Neuveux

Proceedings of the 2008 IEEE International Test Conference, 2008

2004

Changing the Scan Enable during Shift.

Nodari Sitchinava, Samitha Samaranayake, Rohit Kapur, Emil Gizdarski, Frederic Neuveux, Thomas W. Williams

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

2003

A Reconfigurable Shared Scan-in Architecture.

Samitha Samaranayake, Emil Gizdarski, Nodari Sitchinava, Frederic Neuveux, Rohit Kapur, Thomas W. Williams

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

2002

Integrating DFT in the Physical Synthesis Flow.

Loïs Guiller, Frederic Neuveux, S. Duggirala, R. Chandramouli, Rohit Kapur

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Test-model based hierarchical DFT synthesis.

Sanjay Ramnath, Frederic Neuveux, Mokhtar Hirech, Felix Ng

Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, 2002