Frédéric Lalande

According to our database1, Frédéric Lalande authored at least 7 papers between 2007 and 2012.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

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Bibliography

2012
Investigation of the effects of constant voltage stress on thin SiO<sub>2</sub> layers using dynamic measurement protocols.
Microelectron. Reliab., 2012

2010
Leakage paths identification in NVM using biased data retention.
Microelectron. Reliab., 2010

2009
A Modelisation of the temperature dependence of the Fowler-Nordheim current in EEPROM memories.
Microelectron. Reliab., 2009

Modeling charge variation during data retention of MLC Flash memories.
Microelectron. Reliab., 2009

Extraction of 3D parasitic capacitances in 90 nm and 22 nm NAND flash memories.
Microelectron. Reliab., 2009

2008
Flash Memory Cell Compact Modeling Using PSP Model.
Proceedings of the 2008 IEEE International Behavioral Modeling and Simulation Workshop, 2008

2007
A new method to quantify retention-failed cells of an EEPROM CAST.
Microelectron. Reliab., 2007


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